Equipment

Equipment in the Electron Microscopy facility at the Virginia Institute of Marine Science (VIMS) includes:

Zeiss CEM 902 Transmission Electron Microscope

This instrument is equipped with an in-column electromagnetic prism/spectrometer for bright-field operation and qualitative Electron Energy Loss Spectroscopy (EELS).

• Acceleration voltages:  50 and 80 kV
• Spatial resolution, with elastically scattered electrons at 80 kV: lattice = 0.344 nm and point = 0.5 nm
• Magnification range:  150 X to 250 kx with a high magnification step of 400 kx

Imaging with Electron Energy Loss Spectroscopy (EELS) allows for:

• Contrast enhancement of thick sections (0.5 µm) in brightfield mode (inelastically scattered electrons filtered out)
• Contrast enhancement of ultrathin, unstained sections in brightfield mode
• Qualitative elemental distribution in ultrathin (30 µm) sections imaged using inelastically scattered electrons with element-specific energy loses
• In-vacuum 3.5 x 4 inch format camera system (high resolution scanner with glassless scanning capability availability

LEO 435VP Scanning Electron Microscope

This instrument is fitted with an IXRF Energy Dispersive X-ray Spectroscopy System, and a Mitsubishi Video Dye Sublimation Printer

• Acceleration voltage range:  300V to 30kV
• Spatial resolution:  high vacuum mode, 4.0 nm; variable pressure mode, 6.0nm
• Probe current range:  1pA to 500nA
• Magnification range:  15x to 300kx
• Secondary and four-quadrant backscatter emission detectors
• Variable pressure mode allowing for backscatter imaging of non-conductive samples
• Digital image acquisition
• Si(Li) EDS X-ray detector with sensitivity range from boron through uranium

Additional Ancillary Equipment

• Reichert-Jung Ultracut E ultramicrotome
• Reichert-Jung Supercut 2050 microtome (for cutting high-resolution light microscopy samples embedded in GMA/Historesin-like systems)
• LKB 7801A Triangular Glass Knife Maker
• Reichert-Jung Ralph Knife Maker
• Polaron E3100 Critical Point Dryer
• Anatech Hummer VII Sputter Coater, with ancillary carbon evaporative head
• Agfa DuoScan HiD Scanner
• Fully operational darkroom equipped with a Durst Laborator S45 EM Enlarger